Parasitic capacitance in high-performance integrated circuits can be measured in femtofarads (1 fF = 0.001 pF = 10 −15 F), while high-performance test equipment can detect changes in capacitance on the order of tens of attofarads (1 aF = 10 −18 F). The size of commercially available capacitors ranges from around 0.1 pF to 5 000 F (5 kF) supercapacitors. The nanofarad ( nF) is uncommon in North America. The millifarad ( mF) is rarely used in practice a capacitance of 4.7 mF (0.0047 F), for example, is instead written as 4 700 μF. Values of capacitors are usually specified in terms of SI prefix#List of SI prefixes of farads (F), microfarads ( μF), nanofarads ( nF) and picofarads ( pF). Modern capacitors are constructed using a range of manufacturing techniques and materials to provide the extraordinarily wide range of capacitance values used in electronics applications from femtofarads to farads, with maximum-voltage ratings ranging from a few volts to several kilovolts. It is the accumulation of electric charge on the plates that results in capacitance. The original capacitor was the Leyden jar developed in the 18th century. Explanation Įxamples of different types of capacitorsĪ capacitor generally consists of two conducting surfaces, frequently referred to as plates, separated by an insulating layer usually referred to as a dielectric. In 1881 at the International Congress of Electricians in Paris, the name farad was officially used for the unit of electrical capacitance. The term "farad" was originally coined by Latimer Clark and Charles Bright in 1861, in honor of Michael Faraday, for a unit of quantity of charge, but by 1873, the farad had become a unit of capacitance. Where F = farad, C = coulomb, V = volt, W = watt, J = joule, N = newton, Ω = ohm, Hz = Hertz, S = siemens, H = henry.
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